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Sistemy i Sredstva Informatiki [Systems and Means of Informatics], 2010, Volume 20, Issue 1, Pages 59–72 (Mi ssi192)  

This article is cited in 1 scientific paper (total in 1 paper)

The impact of transient failures on microprocessor systems cache reliability

V. Zakharov, B. Shmeilin
Full-text PDF (458 kB) Citations (1)
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Abstract: The impacts of transient failures on cache reliability regarding the data, address tags, and status bits are considered. The behavioral model of data elements, address tags, and status bits reflecting their vulnerability to transient failures is proposed. For some applications, to increase fault tolerance, it is recommended to use a cache with write-through instead of a cache with write-back. It is shown that in multiprocessing systems the sensitivity of status bits to transient failures can be lowered by using the write protocol with updating instead of write protocol with invalidation.
Keywords: transient failures; vulnerability to transient failures; cache with write; cache with write back; address tags; status bits; Hamming distance.
Document Type: Article
UDC: 004.3
Language: Russian
Citation: V. Zakharov, B. Shmeilin, “The impact of transient failures on microprocessor systems cache reliability”, Sistemy i Sredstva Inform., 20:1 (2010), 59–72
Citation in format AMSBIB
\Bibitem{ZakShm10}
\by V.~Zakharov, B.~Shmeilin
\paper The impact of transient failures on microprocessor systems cache reliability
\jour Sistemy i Sredstva Inform.
\yr 2010
\vol 20
\issue 1
\pages 59--72
\mathnet{http://mi.mathnet.ru/ssi192}
Linking options:
  • https://www.mathnet.ru/eng/ssi192
  • https://www.mathnet.ru/eng/ssi/v20/i1/p59
  • This publication is cited in the following 1 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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